The transmission electron microscope is a very powerful tool for material science. The transmission electron microscope (TEM) is used to examine the structure, composition, and properties of specimens in submicron detail. The specimens are mounted onto a TEM specimen holder and locked into position to examine the subject from different angles, tilts etc. Current designs do not accommodate a TEM holder that not only be used for standard TEM grid placement but also allows for placing microfabricated Si/SiN chips with steep tilting angles. UIC researchers have developed a versatile chip to mount standard specimens and microfabricated chips with steep tilting angles and easier access to mount/dismount of specimen Mark Krivchenia krivchen@otm.uic.edu (312) 996-6626
Smart, interactive desk
May 8, 2023
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Get ready to take your space management game to the next level with the University of Glasgow’s innovative project! By combining the